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Influence of working pressure on ZnO:Al films from tube targets for silicon thin film solar cells
Authors:H Zhu  J Hüpkes  A Gerber
Affiliation:a Engineering Research Center for Nanophotonics and Advanced Instrument, Ministry of Education, East China Normal University, 200062 Shanghai, PR China
b Institute of Photovoltaics, Research Centre Jülich, D-52425 Jülich, Germany
Abstract:Mid-frequency magnetron sputtering of aluminum doped zinc oxide films (ZnO:Al) from tube ceramic targets has been investigated for silicon based thin film solar cell applications. The influence of working pressure on structural, electrical, and optical properties of sputtered ZnO:Al films was studied. ZnO:Al thin films with a minimum resistivity of 3.4 × 104 Ω cm, high mobility of 50 cm²/Vs, and high optical transmission close to 90% in visible spectrum region were achieved. The surface texture of ZnO:Al films after a chemical etching step was investigated. A gradual increase in feature sizes (diameter and depth) was observed with increasing sputter pressure. Silicon based thin film solar cells were prepared using the etched ZnO:Al films as front contacts. Energy conversion efficiencies of up to 10.2% were obtained for amorphous/microcrystalline silicon tandem solar cells.
Keywords:Magnetron sputtering  ZnO:Al films  Thin film silicon solar cells
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