Growth and structure characterization of epitaxial Bi2Sr2Co2Oy thermoelectric thin films on LaAlO3 (001)期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Growth and structure characterization of epitaxial Bi₂Sr₂Co₂O_y thermoelectric thin films on LaAlO₃ (001)

Authors:	Shufang Wang Liping He Jingchun Chen Mingjing Chen Guangsheng Fu

Affiliation:	^a College of Physics Science and Technology, Hebei University, 071002 Baoding, China ^b Institut Electronique Microélectronique Nanotechnologie IEMN DOAE CNRS UMR 8520, Université de Valenciennes, Le Mont Houy Valenciennes Cedex F-59309, France

Abstract:	Epitaxial Bi₂Sr₂Co₂O_y thin films with excellent c-axis and ab-plane alignments have been grown on (001) LaAlO₃ substrates by chemical solution deposition using metal acetates as starting materials. Microstructure studies show that the resulting Bi₂Sr₂Co₂O_y films have a well-ordered layer structure with a flat and clear interface with the substrate. Scanning electron microscopy of the films reveals a step-terrace surface structure without any microcracks and pores. At room temperature, the epitaxial Bi₂Sr₂Co₂O_y films exhibit a resistivity of about 2 mΩ cm and a seebeck coefficient of about 115 μV/K comparable to those of single crystals.

Keywords:	Thermoelectric properties Thin films Bi₂Sr₂Co₂O_y Epitaxial growth Microstructure Chemical solution deposition X-ray diffraction Transmission electron microscopy A
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