Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements |
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| Authors: | Cardin Julien Leduc Dominique |
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| Affiliation: | SIFCOM, CNRS UMR 6176, ENSICAEN, 6 Boulevard du Maréchal-Juin, F-14050 Caen Cedex, France. julien.cardin@ensicaen.fr |
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| Abstract: | We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer. |
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