Grain orientation and electrical properties of Sr2Nb2O7 ceramics |
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Authors: | Mikio Fukuhara Chi -Yuen Huang A S Bhalla R E Newnham |
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Affiliation: | (1) Materials Research Laboratory, The Pennsylvania State University, 16802 University Park, Pennsylvania, USA;(2) Present address: Toshiba Tungaloy 1–7, Tsukagoshi, Saiwal-Ku, 210 Kawasaki, Japan |
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Abstract: | Sr2Nb2O7 ceramics sintered at 1753 K and the hot-pressed compacts annealed at 1073 K possess low density because of the formation of voids by large expansion. The expansion is attributed to cleavage and due to the preferential grain growth along the <010> direction. An increase in dielectric constant at temperatures over 973 K and a parabolic decrease of resistivity with increasing temperature are observed. The constant variation corresponds well to the decrease in thermal strain and the grain orientation factor along the <0K0> direction. |
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