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Features of a technique for investigation of partially stabilized zirconia crystals
Authors:M. A. Borik  V. T. Bublik  A. V. Kulebyakin  E. E. Lomonova  V. A. Myzina  F. O. Milovich  N. Yu. Tabachkova
Affiliation:1. Prokhorov Institute of General Physics, Russian Academy of Sciences, Moscow, Russia
2. National University of Science and Technology MISiS, Moscow, Russia
Abstract:The structure of partially stabilized zirconia crystals is investigated by X-ray diffractometry and transmission electron microscopy. It is shown that the combination of structural methods allowed one to reveal features of the structure and phase composition of these materials. Partially stabilized zirconia has a complex twin-domain structure. X-ray diffractometry with the use of K β radiation shows the presence of two phases of the tetragonal modification of zirconia with different tetragonality in all investigated samples independently of the content of the stabilizing impurity. The combination of the locality of transmission microscopy with the integral nature of X-ray diffractometry allowed one to reveal the dependence of the dispersion of twin domains on the concentration of the stabilizing impurity. The use of transmission microscopy with high resolution demonstrates the hierarchy of twinning and the presence of twin domains ~10 nm in width.
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