首页 | 本学科首页   官方微博 | 高级检索  
     

一种用于电源组件的保护电路的优化设计
引用本文:唐万军,廖建军.一种用于电源组件的保护电路的优化设计[J].微电子学,2020,50(2):193-196.
作者姓名:唐万军  廖建军
作者单位:中国电子科技集团公司 第二十四研究所, 重庆 400060
摘    要:对应用于电源组件中的过流/短路保护电路在高温环境下误启动的原因进行了分析,确定导致电路失效的原因为电路参数设计不合理。在上电过程中,误触发保护电路的状态锁存电路会使电路误入保护状态,导致电源组件无法正常上电启动。基于EDA仿真分析工具,得到设计优化方案。R1由原来的10 kΩ降低至5.1 kΩ,R4由原来的6.8 kΩ增大至10 kΩ,C1由510 pF增大至0.1μF,有效解决了保护电路的误启动问题。分析并总结了高可靠保护电路的一般设计流程和关注重点。

关 键 词:失效分析  保护电路  EDA  容差分析
收稿时间:2019/10/10 0:00:00

Optimization Design of a Protection Circuit for Power Supply Module
TANG Wanjun,LIAO Jianjun.Optimization Design of a Protection Circuit for Power Supply Module[J].Microelectronics,2020,50(2):193-196.
Authors:TANG Wanjun  LIAO Jianjun
Affiliation:The 24th Research Institute of China Electronics Technology Group Corporation, Chongqing 400060,P. R. China
Abstract:Reasons of transmitting false start in high temperature environments in the over current/short circuit protection circuits that were used in the power supply modules were analyzed. The reasons were that the circuit design parameters were unreasonable. During the process of power on, the state latch in the protection circuit would be triggered by mistake and make the circuit go into the state of protection, so the power module could not be powered on normally and start to work. Based on EDA simulation tools, a design scheme was optimized. R1 was reduced from 10 kΩ to 5.1 kΩ, R4 was increased from 6.8 kΩ to 10 kΩ, and C1 was increased from 510 pF to 0.1 μF. The problem of false start in the protection circuit was solved effectively. The general design flow for high reliability protection circuits was summarized, and precautions were given.
Keywords:failure analysis  protect circuit  EDA  tolerance analysis
本文献已被 维普 等数据库收录!
点击此处可从《微电子学》浏览原始摘要信息
点击此处可从《微电子学》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号