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Multiparametric characterisation of metal-chalcogen atomic multilayer assembly by potentiodynamic electrochemical impedance spectroscopy
Authors:G.A. Ragoisha  A.S. Bondarenko  N.P. Osipovich  E.A. Streltsov
Affiliation:a Physico-Chemical Research Institute, Belarusian State University, Minsk 220050, Belarus
b Faculty of Science and Technology, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands
c Chemistry Department, Belarusian State University, Minsk 220050, Belarus
Abstract:
Keywords:Underpotential deposition   Adlayer   Metal-chalcogen multilayer   Potentiodynamic electrochemical impedance spectroscopy   Layer-by-layer deposition
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