X射线小角散射法测量纳米粉末的粒度分布

在常规高分辨X射线衍射仪上应用小角散射法测量了ZnO、ZrO2、Fe和Al2O3纳米粉末的粒度分布。测量结果与专用X射线小角散射仪器的测量结果一致，并经TEM分析验证。证明在常规高分辨X射线衍射仪上应用小角散射法测量纳米粉末的粒度是可行的。与采用四狭缝系统或Kratky狭缝系统的专用小角散射仪相比，该方法的特点是操作简单，成本较低，易于推广。目前此法可测量1～300nm范围的粉末粒度。

Determination of particle size distribution of nanometer-sized powder by small angle X-ray scattering method

Particle size distributions of nanometer-sized ZnO, ZrO 2, Fe, Al 2O 3 powders had been determined by small angle X-ray scattering method (SAXS) with a common high-resolution X-ray diffractometer (Philips X'Pert MPD), the results obtained were consistent with those determined by the special SAXS diffractometer and also were partially verified by TEM observation, which indicates that SAXS method using the common high-resolution diffractometer is applicable to measure the particle size distribution of nanometer-sized powder. This method needs no expensive SAXS device and can be more easily operated than that using the special SAXS diffractometer equipped with four slits system or Kratky collimation system. So far the nanometer-sized powder with the particle size less than 300 nm can be measured.