| 力电多场鼓包法测定PZT铁电薄膜的横向压电系数 |
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| 引用本文： | 何元东,孙长振,毛卫国,毛贻齐,张宏龙,陈彦飞,裴永茂,方岱宁.力电多场鼓包法测定PZT铁电薄膜的横向压电系数[J].材料导报,2017,31(15):139-144. |
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| 作者姓名： | 何元东 孙长振 毛卫国 毛贻齐 张宏龙 陈彦飞 裴永茂 方岱宁 |
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| 作者单位： | 1. 湘潭大学材料科学与工程学院,湘潭,411105;2. 湖南大学机械与运载工程学院,长沙,410082;3. 北京大学工学院,北京,100871;4. 北京理工大学先进结构技术研究院,北京,100081 |
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| 基金项目： | 国家自然科学基金(11272276；11572277;11302004)；湖南省自然科学基金杰出青年基金(14JJ1020)；国家重大科学仪器设备开发专项(2012YQ03007502) 何元东:1990年生,硕士,研究方向为功能薄膜材料与器件 E-mail:hyd6029@126.com 毛卫国:通讯作者,男,1979年生,博士,教授,博士研究生导师,研究方向为智能材料力学性能表征及仪器设备研制 E-mail:ssamao@126.com |
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| 摘 要： | 为表征Pb(Zr_(0.52)Ti_(0.48))O_3(PZT)薄膜的横向压电性能,以纯力场鼓包测试模型和铁电薄膜材料压电方程为基础,推导了PZT铁电薄膜的力电耦合鼓包本构模型。采用溶胶-凝胶法制备了PZT铁电薄膜,并通过化学腐蚀法获得PZT薄膜鼓包样品。在外加电压为0~14V的条件下进行鼓包测试。结果表明,在纯力场作用下,PZT薄膜的弹性模量和残余应力分别为91.9GPa和36.2MPa;随着电压从2V变化到14V,PZT薄膜的横向压电系数d31从-28.9pm/V变化到-45.8pm/V。本工作所发展的力电耦合鼓包测试技术及力电耦合鼓包本构模型为评价铁电薄膜材料的横向压电性能提供了一种有效的分析方法。
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| 关 键 词： | 横向压电系数 鼓包测试 力电耦合本构 锆钛酸铅薄膜 |
Measurement of Transverse Piezoelectric Coefficients of Pb(Zr0.52Ti0.48)O3 Thin Films by a Mechano-electrical Multiphysics Coupling,Bulge Test Method |
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| HE Yuandong,SUN Changzhen,MAO Weiguo,MAO Yiqi,ZHANG Honglong,CHEN Yanfei,PEI Yongmao and FANG Daining.Measurement of Transverse Piezoelectric Coefficients of Pb(Zr0.52Ti0.48)O3 Thin Films by a Mechano-electrical Multiphysics Coupling,Bulge Test Method[J].Materials Review,2017,31(15):139-144. |
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| Authors: | HE Yuandong SUN Changzhen MAO Weiguo MAO Yiqi ZHANG Honglong CHEN Yanfei PEI Yongmao and FANG Daining |
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| Affiliation: | School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105,School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105,School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105,College of Mechanical and Vehicle Engineering, Hunan University, Changsha 410082,College of Engineering, Peking University, Beijing 100871,College of Engineering, Peking University, Beijing 100871,College of Engineering, Peking University, Beijing 100871 and Institute of Advanced Structure Technology, Beijing Institute of Technology, Beijing 100081 |
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| Abstract: | On the measuring of transverse piezoelectric coefficients of Pb (Zr0.52Ti0.48)O3 (PZT) thin films,we derived the mechano-electrical coupling bulge constitutive equations of PZT thin films on the basis of bulge test model and ferroelectric constitutive equations.The bulge samples were prepared by sol-gel and chemical etching methods.Mechano-electrical coupling bulge tests were performed by using modified force-electric experimental platform under the applied voltage between 0—14 V.The results showed that the elastic modulus and residual stress of PZT thin films were 91.9 GPa and 36.2 MPa under pure force field,respectively.The transverse piezoelectric coefficients d31 of PZT thin films increased from-28.9 pm/V to-45.8 pm/V when the voltage increased from 2 V to 14 V.Our work provides an effective analysis method for the transverse piezoelectric properties of other ferroelectric thin film materials by using the modified mechano-electrical coupling bulge test and the corresponding constitutive equations. |
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| Keywords: | transverse piezoelectric coefficient bulge test mechano-electrical coupling constitutive equation Pb(Zr0 52Ti0 48)-O3 thin films |
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