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基于AdaBoost与GABP的模拟电路软故障诊断方法
引用本文:赵文俊,张强,刘磊,宋家友. 基于AdaBoost与GABP的模拟电路软故障诊断方法[J]. 计算机测量与控制, 2017, 25(12): 21-24, 42
作者姓名:赵文俊  张强  刘磊  宋家友
作者单位:空军第一航空学院 航空电子工程系,河南 信阳8 464000,空军第一航空学院 航空电子工程系,河南 信阳8 464000,郑州大学 信息工程学院,郑州 450001,郑州大学 信息工程学院,郑州 450001
摘    要:针对容差模拟电路软故障诊断精度较低的问题,提出了一种基于AdaBoost与GABP的组合分类器诊断方法;首先,在Pspice中对故障模式进行Monte-Carlo分析,并利用波形有效点提取法提取故障特征,在此基础上,做归一化处理构建神经网络的原始样本;其次,利用GA算法与L-M算法组合优化BP网络构建GABP分类器;最后,利用AdaBoost算法对GABP单分类器进行迭代提升,构建AdaBoost-GABP组合分类器;诊断实例的结果表明,该方法比传统的单分类器诊断方法具有更高的诊断精度、更低的绝对误差,能够克服单分类器容易陷入局部最优,诊断结论不可信的缺陷。

关 键 词:模拟电路软故障诊断  AdaBoost算法  GA算法   Monte-Carlo分析  组合分类器
收稿时间:2017-05-07
修稿时间:2017-05-24

Analog Circuit Soft Fault Diagnosis Method Based on AdaBoost and GABP
Zhao Wenjun,Zhang Qiang,Liu Lei and Song Jiayou. Analog Circuit Soft Fault Diagnosis Method Based on AdaBoost and GABP[J]. Computer Measurement & Control, 2017, 25(12): 21-24, 42
Authors:Zhao Wenjun  Zhang Qiang  Liu Lei  Song Jiayou
Affiliation:First Aeronautical College of Air Force, Xinyang 464000, China,First Aeronautical College of Air Force, Xinyang 464000, China,School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China and School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China
Abstract:The accuracy of soft fault diagnosis for analog circuit with tolerance is relative low, therefore, a new method based on AdaBoost and GABP is proposed. Firstly, fault modes are simulated by Monte-Carlo method, furthermore, the effective point extraction method is used to extract the characteristic of the fault-pattern, on this basis, original samples of neural network is constructed using the normalized fault data. Secondly, GA algorithm and the L-M algorithm are used to optimize BP neural network to construct GABP classifier. Finally, the GABP network was boost by the AdaBoost algorithm to construct the AdaBoost-GABP combination classifier. The example shows that, the method proposed has higher accuracy and lower error than the traditional single classifier, beyond that, the method overcomes the defect that it is easy to fall into local optimum for the single classifier.
Keywords:analog circuit fault diagnosis   AdaBoost algorithm   GA algorithm   Monte-Carlo analysis   combination classifier
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