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VXI数模混合信号集成电路测试系统
引用本文:冯建科,张生文,郭士瑞. VXI数模混合信号集成电路测试系统[J]. 电子测量与仪器学报, 2005, 19(2): 52-57
作者姓名:冯建科  张生文  郭士瑞
作者单位:北京自动测试技术研究所,北京,100088;北京自动测试技术研究所,北京,100088;北京自动测试技术研究所,北京,100088
摘    要:数模混合集成电路测试系统是当前我国的主流测试系统,本文以信息产业部电子信息产业发展基金重点招议标项目(VXI数模混合集成电路测试系统研究开发及产业化)为例进行了介绍。论述基于VXI总线的高速、高密度、多通道、低功耗新型ATE IC测试系统,介绍了系统的软硬件设计。详细论述了全面提高系统开放性、标准化的设计思想。

关 键 词:VXI总线  数模混合集成电路  测试系统

ATS of D/A Mixed Signal IC Test System Based on VXI Bus
Feng Jianke,Zhang Shengwen,Guo Shirui. ATS of D/A Mixed Signal IC Test System Based on VXI Bus[J]. Journal of Electronic Measurement and Instrument, 2005, 19(2): 52-57
Authors:Feng Jianke  Zhang Shengwen  Guo Shirui
Abstract:Now the mixed signal IC testing system has wide application in China. This paper introduced the digital and analog mixed signal Test System IC based on VXI bus that is major project provided by Electronic information technology development foundation of Ministry of Information Industry. The discussion included system hardware and software design based on the high speed, multchannels, low power consumption and compact perfomannce for VXI bus requirement, and emphasized or the upgrading the opening and standardizaton of the system.
Keywords:VXI bus  digital and analog mixed signal IC  test system  
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