| 电压波动和闪烁的解析测量法及其应用与验证 |
| |
| 引用本文： | 吴洁. 电压波动和闪烁的解析测量法及其应用与验证[J]. 电子质量, 2010, 0(4): 15-17 |
| |
| 作者姓名： | 吴洁 |
| |
| 作者单位： | 工业和信息化部电子第五研究所,广东,广州510610 |
| |
| 摘 要： | 文章介绍了针对特定电压变化特性的被测设备的、简单的、低成本的电压波动和闪烁的解析测量法，并将实际解析法测量计算结果与直接测量法结果进行了比较、验证，证明该方法切实可行，且符合标准规定的容差要求。
|
| 关 键 词： | 电磁兼容测量 解析测量法 负载能力 低成本 |
Voltage Fluctuation and Flicker Analytical Measurement and Its Application and Verification |
| |
| Wu Jie. Voltage Fluctuation and Flicker Analytical Measurement and Its Application and Verification[J]. Electronics Quality, 2010, 0(4): 15-17 |
| |
| Authors: | Wu Jie |
| |
| Affiliation: | CEPREI;Guangdong Guangzhou 510610 |
| |
| Abstract: | It recommends one simple and low cost voltage fluctuation and flicker analytical measurement used for voltage characteristics of a particular device under test.The calculation results with direct measurement and analytical method were compared and verified.Prove that the analytical method is feasible.And it meets the standard tolerance requirements. |
| |
| Keywords: | EMC test analytical measurement load Capacity low cost |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
