迈克耳孙干涉仪测薄透明体厚度和折射率

提出用迈克耳孙干涉仪同时测量薄透明体厚度和折射率的新方法．根据本方法，当插入迈克耳孙干涉仪光路中的被测透明体与光路呈不同夹角时，对应光程变化可通过等倾干涉圆环的变化定量测量．推导出圆环数、薄透明体与光路夹角、厚度、折射率关系，据此可测得薄透明体厚度和折射率．使用此方法，光学系统只需在测量前校准，测量中不再变动，可进一步降低系统误差．

The refractive index and thickness of thin transparency measured by Michelson interferometer

A new method is proposed to measure the refractive index and thickness of thin transparency simultaneously by Michelson interferometer.By the method,the optical path difference can be measured quantitatively by the changes in the numbers of the rings of equal inclination,when the angles between lightpath and the measured objects inserted in Michelson interferometer vary.A relationship among the numbers of the rings,the angles between light and the measured objects,the thickness and the refractive index is deduced,then the thickness and refractive index of thin transparency can be calculated.The optical system is not necesary to change when it is calibrated well before the measurement and the systematic errors can be reduced further.