| 统计逼近下的集成电路成品率优化方法 |
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| 引用本文： | 胡建平. 统计逼近下的集成电路成品率优化方法[J]. 半导体技术, 1999, 24(4): 48-51 |
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| 作者姓名： | 胡建平 |
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| 作者单位： | 宁波大学师范学院物理系,宁波315020 |
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| 摘 要： | 考察了集成电路统计最优化问题的特殊性，用统计方法逼近合格电路中接受域，并以此模型估计参数成品率，进行成品率优化，并结合ＣＭＯＳ集成运放电路的设计验证了方法的可行性。
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| 关 键 词： | 集成电路 统计最优化 成品率优化 |
| 修稿时间： | 1998-06-11 |
IC Yield Optimization Technology with Statistical Approximation |
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| Hu Jianping. IC Yield Optimization Technology with Statistical Approximation[J]. Semiconductor Technology, 1999, 24(4): 48-51 |
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| Authors: | Hu Jianping |
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| Abstract: | The specialities of IC statistical optimal problem is considered.An approach for parametric yield optimization is given in which the statistical approximation model to the acceptable region is used to estimate the parametric yield.The design of a CMOS operational amplifier is presented to verify the feasibility of the method. |
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| Keywords: | Integrated circuitStatistical optimizationYield optimization |
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