首页 | 本学科首页   官方微博 | 高级检索  
     

模拟X线头影片的多重分形分析
引用本文:蒋爱平,王祁. 模拟X线头影片的多重分形分析[J]. 控制工程, 2006, 13(6): 609-612
作者姓名:蒋爱平  王祁
作者单位:黑龙江大学,电子工程学院,黑龙江,哈尔滨,150008;哈尔滨工业大学,电气工程学院,黑龙江,哈尔滨,150001;哈尔滨工业大学,电气工程学院,黑龙江,哈尔滨,150001
基金项目:黑龙江省自然科学基金;黑龙江省教育厅科学技术研究项目;黑龙江大学校科研和教改项目
摘    要:介绍了一种用于X线头影片进行边缘检测的多重分形方法,并对模拟X线头影侧位片进行了多重分形性质的分析。通过图像的多重分形谱与权重因子相关性的分析,进一步判定线性区间及适当的权重因子。得到了X线头影片图像的多重分形的线性区间,验证了X线头影片图像的多重分形的几何性质,在分析图像各像素点多重分形谱的基础上获取图像的边缘信息。用该算法进行图像边缘提取,保持和加强图像的局部特性,突出图像的细微处,并且该算法克服了多重分形谱对噪声敏感的缺点,能有效抑制图像中的噪声。分析结果表明,利用多重分形对X线头影片图像进行硬组织内部轮廓的边缘提取是可行的。

关 键 词:图像处理  多重分形  边缘检测  标志点  头影测量
文章编号:1671-7848(2006)06-0609-04
收稿时间:2005-07-21
修稿时间:2005-11-14

Multifractal Analysis of X-ray Cephalogram
JIANG Ai-ping,WANG Qi. Multifractal Analysis of X-ray Cephalogram[J]. Control Engineering of China, 2006, 13(6): 609-612
Authors:JIANG Ai-ping  WANG Qi
Affiliation:1. College of Electronic Engineering, Heilongjiang University, Harbin 150008, China; 2. College of Electrical Engineering, Harbin Institute of Technology, Harbin 150001, China
Abstract:Multifractal approach to detect the edge of ceohalogram is introduced.The multifractal spectrum property of cephalogram is analyzed and the relationship between the multifractal spectrum and its weight is discussed,so the multifractal linear region of cephalogram is determined.The geometrical properties of its multifractal are verified.The edge information used in the above approach shows that the noise could be repressed effectively,the local property of an image could be remained as much as possible,and the fine property could be stressed.It is shown that the edges of inner hard tissues can be detected with multifractal approach.
Keywords:imaging  multifractal  edge detection  landmark  cephalometric
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号