| 一种基于单片机智能电容测试仪的设计与实现 |
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| 引用本文： | 徐思成. 一种基于单片机智能电容测试仪的设计与实现[J]. 现代电子技术, 2010, 33(18): 28-29,34 |
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| 作者姓名： | 徐思成 |
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| 作者单位： | 河南质量工程职业学院,机电工程系,河南,平顶山,467002 |
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| 摘 要： | 在分析和比较传统电容测量仪表的基础上,提出一种新型智能电容测试仪的设计及实现方案。仪表以MCS-51单片机为控制核心,结合多谐振荡器和多路开关,仅用较少的外围资源即可实现,且结构简单,成本低廉,可获测量过程智能化和实现数字显示。经系统测试和使用,该方法性能可靠,测量精度高,弥补了传统测量方法的不足,达到了预期的设计效果。
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| 关 键 词： | 单片机 智能电容测试 多谐振荡器 数字显示 |
Design and Realization of Intelligent Capacitance Tester Based on Single Chip Microcomuter |
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| XU Si-cheng. Design and Realization of Intelligent Capacitance Tester Based on Single Chip Microcomuter[J]. Modern Electronic Technique, 2010, 33(18): 28-29,34 |
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| Authors: | XU Si-cheng |
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| Affiliation: | XU Si-cheng (Department of Mechanical and Electrical Engineering, Henan Quantity Engineering Vocation College, Pingdingshan 467002, China) |
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| Abstract: | A new scheme for design and implementation of the intelligent capacitance tester is proposed based on the analysis and comparison of traditional capacitance measuring instrument. Taking MCS-51 SCM as a control core of the instrument, the instrument was realized in combination with multichannel harmonic oscillator, multi-way switch and fewer external resources, and the measurement process intellectualization, simple structure, low cost and digital display were achieved. The system testing and application prove that the system has reliable performance, high accuracy of measurement, and achieves the desired effect of the design. |
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| Keywords: | single chip micro-controller intelligent capacitance tester multivibrator digital display |
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