| 用分光光度计测量核靶厚度和均匀性 |
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| 引用本文： | 许国基,孟祥金,罗兴华. 用分光光度计测量核靶厚度和均匀性[J]. 原子能科学技术, 1989, 0(1) |
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| 作者姓名： | 许国基 孟祥金 罗兴华 |
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| 作者单位： | 中国原子能科学研究院 北京(许国基，孟祥金)，中国原子能科学研究院 北京(罗兴华) |
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| 摘 要： | 文章叙述了吸光光度法测量核靶厚度和均匀性的一般原理,并给出碳膜和金属膜的具体测量方法,本方法的厚度测量范围为5—200μg/cm~2,测量精度为10%。
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| 关 键 词： | 分光光度计 碳剥离膜 |
THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER |
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| XU GUOJI,MENG XIANGJIN,LUO XINGHUA Institute of Atomic Energy,P. O. Box ,Beijing. THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER[J]. Atomic Energy Science and Technology, 1989, 0(1) |
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| Authors: | XU GUOJI MENG XIANGJIN LUO XINGHUA Institute of Atomic Energy P. O. Box Beijing |
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| Affiliation: | XU GUOJI,MENG XIANGJIN,LUO XINGHUA Institute of Atomic Energy,P. O. Box 275,Beijing |
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| Abstract: | A method for measuring the thickness of thin targets with a spectrophotometeris described. The principle of the method and the instrument used are mentioned.The relation between thickness and absorption for carbon, gold and copper foilsare given. |
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| Keywords: | Spectrophotometer Carbon stripper foil |
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