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原子发射光谱法测定钢中微量硅的研究
引用本文:张书圣,王利峡,许良忠,孙兴刚. 原子发射光谱法测定钢中微量硅的研究[J]. 青岛科技大学学报(自然科学版), 1995, 0(4)
作者姓名:张书圣  王利峡  许良忠  孙兴刚
摘    要:利用光电直读光谱仪探讨了钢中微量硅的发射光谱分析方法,选择Si2881.5A作为分析线,Fe2714.4A作为内标线,对钢中硅测定的线性范围为0.05%~1.3%,对Si含量为0.17%的标准钢样的12次平行测定,相对标准偏差为5.3%,并对标准钢样进行了测定,与理论值相符,本法用于实际样品分析,结果令人满意。

关 键 词:光谱分析;硅;光电直读光谱仪;钢;定量分析

Determination of Trace Silicon in Steel by Atomic Emicssion Spectrometry
Zhang Shuheng, Wang Iixia, Xu Liangzhong, Sun Xinggang. Determination of Trace Silicon in Steel by Atomic Emicssion Spectrometry[J]. Journal of Qingdao University of Science and Technology:Natutral Science Edition, 1995, 0(4)
Authors:Zhang Shuheng   Wang Iixia   Xu Liangzhong   Sun Xinggang
Affiliation:Department of Applied Chemistry
Abstract:A method for the determination of trace silicon in Steel by atomic emission spectrometry with the Photoelectric direct-reading spectrometer is rePOrted. The linear range for silicon in steel is over 0.05% ̄ 1.3%. The method roposed has been applied to the determination of silicon in steel samples with satisfactory results against theorectical values.
Keywords:atomic emission spectrometry  silicon  Photoelectric direct-reading spectrometer  
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