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Improving dynamic domain reduction test data generation method by Euler/Venn reasoning system |
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| Authors: | Nikravan Esmaeel Parsa Saeed |
| Affiliation: | 1.School of Computer Engineering, Iran University of Science and Technology, Tehran, Iran ; |
| Abstract: | Software Quality Journal - Test data adequacy is a major challenge in software testing literature. The difficulty is to provide sufficient test data to assure the correctness of the program under... |
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