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一种基于图像处理的万能工具显微镜测量新方法
引用本文:王波,钮赛赛.一种基于图像处理的万能工具显微镜测量新方法[J].计量学报,2011,32(5):419-423.
作者姓名:王波  钮赛赛
作者单位:1.滁州学院电子信息工程系, 安徽 滁州 239000
2.南京航空航天大学机电学院, 江苏 南京 210016
基金项目:江苏省质量技术监督局科技攻关项目(KY(2007)JX001Z); 2010年江苏省普通高校研究生科研创新计划资助项目(XC10B_107Z)
摘    要:在分析传统万能工具显微镜及现代数字化仪器优缺点的基础上,提出了一种基于图像处理的万能工具显微镜的测量方法。该方法将图像处理技术与基于FPGA和单片机的光栅测量技术相结合,在保证原有仪器的准确度高、抗干扰能力强、稳定性好、应用范围广优点的基础上,运用AutoCAD二次开发技术实现对长度、角度、圆直径等几何量的精密测量,提高了测量效率和精度,降低了操作人员的劳动强度。经过与双频激光干涉仪的测试结果进行比较,证明提出的方法具有较高的重复性和测量精度。

关 键 词:计量学  万能工具显微镜  光栅尺  图像处理  亚像素  

New Measurement of Omnipotence Tool-Microscope Based on Image Processing
WANG Bo,NIU Sai-sai.New Measurement of Omnipotence Tool-Microscope Based on Image Processing[J].Acta Metrologica Sinica,2011,32(5):419-423.
Authors:WANG Bo  NIU Sai-sai
Affiliation:1.College of Electronics and Information Engineering,Chuzhou University, Chuzhou, Anhui 239000, China
2.College of Mechanical & Electrical Engineering,Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China
Abstract:Based on the analysis of the advantages and disadvantages of the traditional omnipotence tool-microscope and modern digital equipment,a new measurement based on image processing is presented.This method combines image measurement technology with grating measurement technology based on FPGA and SCM,and uses AutoCAD secondary development of technology for length,angle,diameter,and other geometric precision measurement of the amount.On the basis of maintained advantages of original equipment such as high precision,strong anti-jamming,long-term stability,wide application and so on,it can improve efficiency and precision of measurement and reduces operation intensity.Compared with the test results of Dual-frequency laser interferometer,it proves that this method has high precision repeatability and measurement accuracy.
Keywords:Metrology  Omnipotence tool-microscope  Grating scale  Image Processing  Sub-pixel  
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