| 滤波器封装盒体气体泄漏失效分析 |
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| 引用本文： | 叶建海,包生祥,马丽丽,庄立波,张德政.滤波器封装盒体气体泄漏失效分析[J].理化检验(物理分册),2011(3):192-195. |
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| 作者姓名： | 叶建海 包生祥 马丽丽 庄立波 张德政 |
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| 作者单位： | 电子科技大学电子薄膜与集成器件国家重点实验室; |
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| 基金项目： | 国防科工委共性基金资助项目 |
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| 摘 要： | 针对滤波器封装盒体气密性检查不合格的问题,运用扫描电镜以及电子探针能谱仪分别对气密性检查合格和不合格的盒体进行了微观结构和成分的分析比较,找出了盒体气体泄漏失效的原因。结果表明:由于气密性检查不合格的盒体材料硅含量偏高,且多以片状、颗粒状形式析出于铝合金表面,因而在此处产生了应力集中,导致了细微裂纹的产生;同时过高的硅含量还破坏了液相金属的焊接熔合性能,降低了熔合区域金属的致密度,使其容易产生焊接缺陷;上述两种原因共同作用最终导致盒体的气密性不合格。最后根据分析结论提出了改进措施。
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| 关 键 词： | 滤波器 铝硅合金 气密性 封装盒体 失效分析 |
Leakage Failure Analysis of Package Box Used for Filter |
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| YE Jian-hai,BAO Sheng-xiang,MA Li-li,ZHUANG Li-bo,ZHANG De-zheng.Leakage Failure Analysis of Package Box Used for Filter[J].Physical Testing and Chemical Analysis Part A:Physical Testing,2011(3):192-195. |
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| Authors: | YE Jian-hai BAO Sheng-xiang MA Li-li ZHUANG Li-bo ZHANG De-zheng |
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| Affiliation: | YE Jian-hai,BAO Sheng-xiang,MA Li-li,ZHUANG Li-bo,ZHANG De-zheng(State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China) |
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| Abstract: | Aimed at the problem of gas leakage of the package box used for filter,SEM and EDS were used to compare and analyze the different microstructure and element composition between the qualified and failure package box samples,and the failure causes were discussed.The results showed that the high concentration silicon was precipitated on the surface of aluminum alloy package box mostly in the flake and granular forms.That resulted in stress concentration,reduced the fusion performance of liquid metal welding an... |
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| Keywords: | filter aluminum silicon alloy air tightness package box failure analysis |
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