Confocal fluorescence microscopy in alumina-based ceramics: Where does the signal come from? |
| |
| Authors: | Sheng Guo Richard I Todd |
| |
| Affiliation: | 1. Department of Endocrinology and Metabolism, Kangbuk Samsung Hospital, Sungkyunkwan University School of Medicine, Seoul, South Korea;2. Department of Neurology, Soonchunhyang University College of Medicine, Cheonan, South Korea;1. Institute of Chemistry, University of Silesia, Szkolna 9, 40-007 Katowice, Poland;2. Institute of Materials Science, University of Silesia, 75 Pu?ku Piechoty 1A, 41-500 Chorzów, Poland;1. Institute of Materials Science and Engineering, Shijiazhuang University of Economics, Shijiazhuang 050031, PR China;2. College of Chemistry and Material Science, Hebei Normal University, Shijiazhuang 050016, PR China;1. Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK;2. Warwick Manufacturing Group, University of Warwick, Coventry, CV4 7AL, UK;3. Faculty of Dentistry, University of Malaya, Kuala Lumpur, 50603, Malaysia;4. Faculty of Mechanical Engineering, Otto-von-Guericke-Universität Magdeburg, Universitätsplatz 2, D-39016 Magdeburg, Germany;5. Research Institute of Science and Technology for Ceramics, ISTEC-CNR, Via Granarolo 64, 48018 Faenza, Italy |
| |
| Abstract: | Confocal Cr3+ fluorescence microscopy is an ideal technique for investigating residual stresses in alumina-based ceramics. Due to their transparency, however, it is important to understand where the collected signal comes from by characterising the probe response function (PRF). Here, a PRF is proposed that captures all the relevant physical effects, including a newly identified consequence of scattering by pores and grain boundaries. The new PRF describes the response of a range of alumina-based ceramics to depth scanning in a high resolution confocal fluorescence microscope in a manner that balances physical significance with the accuracy of empirical fitting. The results showed that measurements could be made deep within single crystals of sapphire and ruby, although refraction degraded the depth resolution from about 3 μm at the surface to 25 μm at a depth of 500 μm. Scattering and absorption limited the depth to which polycrystalline alumina could be probed to ～15 μm. This was further reduced to ～4 μm for an alumina–10 vol.% SiC nanocomposite. However, the absorption increased the accuracy of near surface measurements in these materials by preventing contamination from subsurface fluorescence. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
