X-ray nano computerised tomography of SOFC electrodes using a focused ion beam sample-preparation technique |
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| Authors: | P.R. Shearing J. Gelb N.P. Brandon |
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| Affiliation: | 1. CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France;2. European Synchrotron Radiation Facility (ESRF), 6 Rue Jules Horowitz BP 220, 38043 Grenoble, France;3. CEA-Liten, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France;4. École des Mines de Saint-Étienne, CNRS UMR 5307, 158 cours Fauriel, 42023 Saint-Étienne, Cedex 2, France;1. Univ. Grenoble Alpes – CEA/LITEN, 17 rue des Martyrs, 38054 Grenoble, France;2. European Synchrotron Radiation Facility (ESRF), 71 avenue des Martyrs, 38000 Grenoble, France;3. Univ. Grenoble Alpes – CEA/LETI, 17 rue des Martyrs, 38054 Grenoble, France;4. FUELMAT Group, Faculty of Engineering Sciences (STI), Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland;5. Univ. Grenoble Alpes – LEPMI, 38000 Grenoble, France;6. CNRS, LEPMI, 38000 Grenoble, France |
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| Abstract: | High-resolution tomography techniques have facilitated an improved understanding of solid oxide fuel cell (SOFC) electrode microstructures.The use of X-ray nano computerised tomography (nano-CT) imposes some geometrical constraints on the sample under investigation; in this paper, we present the development of an advanced preparation technique to optimise sample geometries for X-ray nano-CT, utilizing a focused ion beam (FIB) system to shape the sample according to the X-ray field of view at the required magnification.The technique has been successfully applied to a Ni-YSZ electrode material: X-ray nano-CT has been conducted at varying length scales and is shown to provide good agreement; comparison of results from X-ray and more conventional FIB tomography is also demonstrated to be favourable.Tomographic reconstructions of SOFC electrodes with volumes spanning two orders of magnitude are presented. |
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