基于Ultra-FLEX测试系统的集成电路测试开发

在半导体技术高速发展的今天,对集成电路的测试要求越来越高,测试开发的难度、复杂度都在增加,如何应对当前集成电路的测试需求,成为测试开发者需要考虑的问题。Ultra-FLEX测试系统是新一代的测试系统,用以应对当今的测试需求。文章介绍了Ultra-FLEX测试系统的硬件资源,列举了部分模块及其功能和参数;描述了一般集成电路测试开发的流程,并以数字集成电路为例介绍了相关测试内容;介绍了Ultra-FLEX测试系统的软件环境,列举了测试程序构成要素以及各自功能;介绍了Ultra-FLEX测试系统的程序调试环境,测试系统提供的调试工具以及调试方法。

Testing Development of IC on Ultra-FLEX Test System

Today, as the semiconductor technology is developing very fast, it requires high level testing, testing development becomes more difficult, more complex, how to satisfy the testing requirement is a question which testing developer need to think. Ultra-FLEX is a new generation test system which is used to test current integrated circuit. This article introduce the hardware of Ultra-FLEX, list some of the options and their function and parameter; describe the general procedure of testing development, and introduce the testing items of digital IC as example; introduce the software environment of Ultra-FLEX, list the content of a testing program and their function; introduce the debugging environment of Ultra-FLEX, the debugging tools provided by the system, and the debugging method.