TiO2光催化薄膜的XPS研究

利用ＴｉＯ２溶胶通过浸涂技术在钠钙玻璃表面制备了ＴｉＯ２光催化薄膜，根据Ｘ射线光电子能谱（ＸＰＳ）对薄膜进行了表征。结果表明，薄膜中除含有＋４价Ｔｉ的氧化物外，还有一定量的＋３和＋２价Ｔｉ的氧化物。结合有机基团燃烧的还原作用、玻璃中钠与钙离子的扩散和Ａｒ离子刻蚀，对这种现象作了讨论。Ｏｌｓ的高分辨谱比文献报道的更复杂。元素在薄膜内层的分布更均匀，从表面到内层，Ｏ和Ｔｉ元素的含量明显增加，而Ｃ、Ｎａ

XPS STUDY ON TiO2 PHOTOCATALYTIC THIN FILM PREPARED BY THE SOL-GEL METHOD

TiO_2 photocatalytic thin films on a soda-lime glass substrate were prepared by a dip-coating technique using TiO2 sol solution and characterized by X-ray photoelectron spectroscopy (XPS). The results showed that besides oxides of Ti(IV) there was a certain amount of oxides of Ti(III) and Ti(II). The phenomenon was discussed in relation to the reduction of residual carbons from organic radicals, the conditions of argon-ion sputtering and the diffusion of sodium and calcium ions from the glass substrates. The spectra of O1s were more complicated than those of O1s reported previously in literature, and elements were comparatively uniformly distributed in depth, while there were obvious increases in titanium and oxygen contents and decreases in the concentrations of carbon, sodium and calcium from the surface to the depth.