| 与控制点方法论相结合的V-mask累积和控制图 |
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| 引用本文： | 何桢,商艳芬.与控制点方法论相结合的V-mask累积和控制图[J].工业工程,2007,10(1):48-52. |
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| 作者姓名： | 何桢 商艳芬 |
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| 作者单位： | 天津大学,管理学院,天津,300072 |
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| 基金项目： | 国家自然科学基金
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教育部跨世纪优秀人才培养计划 |
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| 摘 要： | V-mask累积和控制图虽然能够有效地监控过程中发生的微小偏移,但是因为它需要存储大量统计量且计算时间较长,所以在计算机中实施起来比较困难.为了解决这一问题,介绍了将控制点方法论应用于V-mask累积和控制图这一方法,并通过实例来进一步说明.结果表明,与控制点方法论结合的控制图减少了存储量,缩短了计算时间,而且将在顾客满意度控制中得到广泛应用.
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| 关 键 词： | 顾客满意度 V-mask累积和控制图 控制点方法论 |
| 文章编号： | 1007-7375(2007)01-0048-05 |
| 修稿时间： | 2005-08-26 |
V-mask CUSUM Control Charts with the Control Point Methodology |
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| HE Zhen,SHANG Yan-fen.V-mask CUSUM Control Charts with the Control Point Methodology[J].Industrial Engineering Journal,2007,10(1):48-52. |
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| Authors: | HE Zhen SHANG Yan-fen |
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| Affiliation: | School of Management, Tianjin University,Tianjin 300072, China |
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| Abstract: | V-mask CUSUM control charts can effectively supervise and control the small shifts in the process.However,it is difficult to implement it on computers,because it will store many CUSUM points and need a lot of computing time.To solve these problems,the paper introduces V-mask CUSUM control charts with the control point methodology(CPM),and then further illuminates this method by an example.The result indicates that V-mask CUSUM control charts can reduce the storage and computing time,and will be widely applied in the controlling of customer satisfaction. |
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| Keywords: | customer satisfaction V-mask CUSUM control chart control point methodology |
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