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Characterization of catastrophic faults in two-dimensional reconfigurable systolic arrays with unidirectional links |
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| Authors: | Soumen Maity Bimal K. Roy |
| Affiliation: | a Department of Mathematics, Indian Institute of Technology, Guwahati 781 039, Assam, India b School of Information Technology and Engineering, University of Ottawa, 800 King Edward Avenue, Ottawa, ON K1N 6N5, Canada c Applied Statistics Unit, Indian Statistical Institute, 203 B. T. Road, Calcutta 700 108, India |
| Abstract: | The catastrophic fault pattern is a pattern of faults occurring at strategic locations that may render a system unusable regardless of its component redundancy and of its reconfiguration capabilities. In this paper, we extend the characterization of catastrophic fault patterns known for linear arrays to two-dimensional VLSI arrays in which all links are unidirectional. We determine the minimum number of faults required for a fault pattern to be catastrophic and give algorithm for the construction of catastrophic fault patterns with minimum number of faults. |
| Keywords: | Catastrophic fault patterns Fault tolerance Algorithms |
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