| 大容量存储器集成电路的测试 |
| |
| 引用本文： | 杨富征. 大容量存储器集成电路的测试[J]. 电子工业专用设备, 2005, 34(5): 49-52 |
| |
| 作者姓名： | 杨富征 |
| |
| 作者单位： | 华凯科技有限公司,广东,江门,509100 |
| |
| 摘 要： | 介绍了有关大容量存储器集成电路测试系统的软件原理和硬件构成,对大容量存储器集成电路的测试方法作了初步探讨,希望对实现实验室精确测试和生产中大批量芯片中测和成品测试有所帮助。
|
| 关 键 词： | 测试系统 存储器集成电路 块 页 |
| 文章编号： | 1004-4507(2005)05-0049-04 |
| 修稿时间： | 2005-04-27 |
The Testing Technology of MSF Memory Integrated Circuit |
| |
| YANG Fu-zheng. The Testing Technology of MSF Memory Integrated Circuit[J]. Equipment for Electronic Products Marufacturing, 2005, 34(5): 49-52 |
| |
| Authors: | YANG Fu-zheng |
| |
| Abstract: | The software scheme and hardware connections of testing system for MSF memory IC are introduced,and the testing technology of MSF memory IC are preliminary discussed in this paper.Wish it is available to exactly test in laboratory,large quantilies chip and finished product test in produce process.Go-ahead with craft brothers together on the testing technique and testing equpment of MSF IC. |
| |
| Keywords: | Testing system Memory IC Bank Page |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
