STM研究光盘材料结构转变前后表面形貌的分形维数

采用ＳＴＭ在纳米尺度上对光盘材料结构转变前后表面微观形貌进行了研究，ＳＴＭ结合图象处理和傅利叶分析法可以较好地用于研究薄膜表面形貌的分形特征，用电子束蒸发制备的无定形态记录介质薄膜表面形貌在纳米尺度上呈现出分形特征，经加热晶化后介质薄膜发生结构转变，表面形貌的分形维数增加。

Study on Fractal Dimension of Sutface Morphology Befote r After the Structure-change by STM

TM has been used to investigate the nanometer-scale morphology of the surface of recording media before or after the structure change. Combining the image-processing software with Fourier analysis method,STM can be used properly to study the fractal property of the morphology of the films The mor-phology of the amorphous film,which is prepared by electron beam evaporation method isplays fractal property in nanometer scale. After heating,the film transforms from non-crystalline state to crystalline state,and the fractal dimension of its surface morphology increases.