| Abstract: | Pressed films of blends of polystyrene (PS) with ethylene–propylene diene monomer rubber (EPDM) or grafted copolymer of styrene (St) onto EPDM (EPDM-g-St) rubber were examined by small-angle X-ray scattering (SAXS), and scanning electron microscope (SEM). Small-angle X-ray scattering from the relation of phase was analyzed using Porod's Law and led to value of interface layer on blends. The thickness of interface layer (σb) had a maximum value at 50/50 (PS–EPDM-g-St) on blends. The radius of gyration of dispersed phase (domain) and correlation distances ac in blends of PS–EPDM-g-St were calculated using the data of SAXS. The morphology and structure of blends were investigated by SEM. © 1998 John Wiley & Sons, Inc. J. Appl. Polym. Sci. 70: 805–810, 1998 |
