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Effect of hollow pores on the detection characteristics of trans-stilbene crystals grown by vertical Bridgman technique |
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| Authors: | Arjunan?Arulchakkaravarthi Parthasarathy?Santhanaraghavan Krishnan?Sivaji Rakesh?Kumar Sivaramakrishnan?Muralithar Rengasamy?Gopalakrishnan |
| Affiliation: | (1) Crystal Growth Centre, Anna University, Chennai-600 025, India,;(2) Dept. of Electrical Engineering, National Tsing Hua Univeristy, Hsinchu, Taiwan,;(3) Materials Science Centre, Department of Nuclear Physics, University of Madras, Chennai-600 025, India,;(4) Nuclear Science Centre, New Delhi-110 036, India,;(5) Dept. of Physics, Anna University, Chennai-600 025, India, |
| Abstract: | Bulk crystals of trans-stilbene were grown using Vertical Bridgman Technique with progressive modification of growth parameters. The grown crystals were studied for their performance in time resolution setup with two anti collinear gamma rays from 22Na sources. The crystals were subjected to optical microscopic and Scanning Electron Microscopic (SEM) studies. The microscopic defects (hollow pores) in the grown crystals and their effect on the detection characteristics are reported. |
| Keywords: | Trans-stilbene Hollow pores Time resolution Crystal growth Scanning electron Microscopic studies Scintillation Bridgman technique Organic molecular Crystal Microscopic defects |
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