Characterization of the Soft X-Ray Emission from the APF Plasma Focus Device Operated in Neon |
| |
| Authors: | R. Baghdadi R. Amrollahi G. R. Etaati M. Habibi A. Roomi |
| |
| Affiliation: | (1) Plasma Physics Laboratory, Amirkabir University of Technology, Tehran, Iran;(2) Department of Science, University of Putra, Putra, Malaysia |
| |
| Abstract: | Experimental results related to soft X-ray (SXR) properties of Neon plasma on the APF plasma focus device is presented. The experiments were carried on over wide range of neon pressure and at voltages 11, 12 and 13 kV six filtered photo PIN diodes and pin-hole camera. For the charging voltages of 11–13 kV with 2.17–3.04 kJ stored energy, the optimum operating pressure in neon is found to be in the range of 3.5–5 torr. The behavior of SXR intensities was registered by different filters and found out that Al-Mylar 6 μm and Cu 10 μm has the highest and lowest amount of X-ray transmission, respectively. |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
