Double slit interferometry to measure the EUV refractive indices of solids using high harmonics |
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Authors: | Wilson Lucy A Rossall Andrew K Wagenaars Erik Cacho Cephise M Springate Emma Turcu I C Edmond Tallents Greg J |
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Affiliation: | York Plasma Institute, The Department of Physics, The University of York, York, UK. law504@york.ac.uk |
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Abstract: | Accurate values of the extreme ultraviolet (EUV) optical properties of materials are required to make EUV optics such as filters and multilayer mirrors. The optical properties of aluminum studied in this report are required, in particular, as aluminum is used as an EUV filter material. The complex refractive index of solid aluminum and the imaginary part of the refractive index of solid iron between 17 eV and 39 eV have been measured using EUV harmonics produced from an 800 nm laser focused to 10(14) Wcm(2) in an argon gas jet impinging on a double slit interferometer. |
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