Concurrent Flaw Populations in SiC |
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Authors: | T. E. Easler, R. C. Bradt, R. E. Tressler, |
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Affiliation: | Ceramic Science and Engineering Section, Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 |
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Abstract: | Concurrent surface and edge flaw populations were identified on fracture surfaces of as-machined specimens of sintered silicon carbide. The overall strength distribution and the individual concurrent distributions were estimated using Weibull statistics. Design implications of using a single flaw population and the difficulties associated with rigorously separating the concurrent distributions are discussed. |
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