首页 | 本学科首页   官方微博 | 高级检索  
     

钝化界面植氢优化的碲镉汞中波红外探测芯片
引用本文:叶振华,黄建,尹文婷,冯婧文,陈洪雷,陈路,廖清君,林春,胡晓宁,丁瑞军,何力. 钝化界面植氢优化的碲镉汞中波红外探测芯片[J]. 红外与毫米波学报, 2011, 30(3): 260-262
作者姓名:叶振华  黄建  尹文婷  冯婧文  陈洪雷  陈路  廖清君  林春  胡晓宁  丁瑞军  何力
作者单位:1. 中国科学院上海技术物理所,红外成像材料与器件重点实验室,上海200083
2. 中国科学院上海技术物理所,红外成像材料与器件重点实验室,上海200083;中国科学院研究生院,北京100039
基金项目:国家自然科学基金项目(面上项目,重点项目,重大项目),中国科学院重大资助项目,中国科学院重点资助项目
摘    要:报道了在钝化界面进行低能等离子体植氢优化的n+-on-p碲镉汞(HgCdTe)中波(MW,mid-wavelength)光伏红外探测芯片的研究成果.基于由采用分子束外延技术生长的HgCdTe薄膜材料,通过注入阻挡层的生长、注入窗口的光刻、形成光电二极管的B+注入、钝化介质膜的生长、优化钝化界面的等离子体植氢、金属化和铟...

关 键 词:HgCdTe  钝化界面  等离子体植氢  暗电流
收稿时间:2010-05-24
修稿时间:2010-07-06

HgCdTe mid wavelength infrared detector with interface passivated by hydrogen implantation
Ye Zhenhu,HUANG Jian,YIN Wen-Ting,FENG Jing-Wen,CHEN Hong-Lei,CHEN Lu,LIAO Qing-Jun,LIN Chun,HU Xiao-Ning,DING Rui-Jun and HE Li. HgCdTe mid wavelength infrared detector with interface passivated by hydrogen implantation[J]. Journal of Infrared and Millimeter Waves, 2011, 30(3): 260-262
Authors:Ye Zhenhu  HUANG Jian  YIN Wen-Ting  FENG Jing-Wen  CHEN Hong-Lei  CHEN Lu  LIAO Qing-Jun  LIN Chun  HU Xiao-Ning  DING Rui-Jun  HE Li
Affiliation:Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai 200083, China
Abstract:The results of n+-on-p HgCdTe mid-wavelength infrared detector with passivation interface optimized using high-density hydrogen plasma implantation were presented in this paper. By implantation barrier layer deposition, ion-implantation window exposure, B+ implantation, passivation film deposition, plasma hydrogen-implantation, metallization and indium-bump arrays fabrication, n+-on-p HgCdTe mid-wavelength infrared detector with passivation interface optimized was achieved from a Hg1-xCdxTe film grown by MBE. Cut-in voltages of HgCdTe mid-wavelength detector Photodiodes with interface optimized were 50mV approximately larger than those of the one without having been optimized, dynamic resistances among the zero bias and reverse bias region were improved 10 times and dynamic resistances among the larger forward region were decreased significantly. Thus, it is obvious that plasma hydrogen-implantation was beneficial to suppress the dark currents and improve the ohmic contact of HgCdTe mid-wavelength infrared detector photodiodes, and then to enhance the operating dynamic range and performance uniformity.
Keywords:HgCdTe   passivation interface   hydrogen-implantation   dark current
本文献已被 万方数据 等数据库收录!
点击此处可从《红外与毫米波学报》浏览原始摘要信息
点击此处可从《红外与毫米波学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号