High-speed InGaP/GaAs transistors with a sidewall base contactstructure |
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Authors: | Mochizuki K Tanoue T Oka T Ouchi K Hirata K Nakamura T |
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Affiliation: | Central Res. Lab., Hitachi Ltd., Tokyo; |
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Abstract: | We have fabricated InGaP/GaAs double heterojunction bipolar transistors with a sidewall base contact structure. These transistors operate in both emitter-up and emitter-down modes. Symmetric characteristics of the cutoff frequency fT=68 GHz and the maximum oscillation frequency fmax=31 GHz were obtained at a base-collector bias VBC of 0 V. For emitter-down operation, f T was found to reach a maximum of 78 GHz when the base-collector junction was forward biased at 0.9 V. The product of f T for emitter-down operation and fT for emitter-up operation was 5.3×103 GHz2, which is about six times that of previously reported SiGe heterojunction bipolar transistors |
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