| 板级SRAM的内建自测试(BIST)设计 |
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| 引用本文： | 张勇,谈恩民.板级SRAM的内建自测试(BIST)设计[J].桂林电子科技大学学报,2004,24(2):60-63. |
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| 作者姓名： | 张勇 谈恩民 |
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| 作者单位： | 桂林电子工业学院,电子工程系,广西,桂林,541004 |
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| 基金项目： | 广西科学基金项目(桂科青0135024) |
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| 摘 要： | 板级SRAM的内建自测试的设计,是为了确保板级SRAM的可靠性。考虑到板级SRAM各种故障模型,选择使用MarchC-SOF算法,其对呆滞故障、跳变故障、开路故障、地址译码器故障和字节间组合故障有100%的故障覆盖率,优化面向"字节"的MarchC-SOF算法和扩展延时元素后,算法可对SRAM进行字节内组合故障和数据维持力故障测试。同时在只增加少量成本的情况下,使用FPGA构成存储器的BIST控制器,可以满足SRAM的可测性的要求。
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| 关 键 词： | BIST SRAM故障模型 SRAM测试 March算法 |
| 文章编号： | 1001-7437(2004)02-60-04 |
| 修稿时间： | 2003年9月3日 |
BIST for SRAM in PCB Level |
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| ZHANG Yong,TAN En-min.BIST for SRAM in PCB Level[J].Journal of Guilin Institute of Electronic Technology,2004,24(2):60-63. |
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| Authors: | ZHANG Yong TAN En-min |
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| Abstract: | SRAM is widely used in digital system.In order to maintain its reliability,a BIST structure in PCB level is presented.The fault models in SRAM are discussed first,and then March C-SOF algorithm is selected in the design.It has 100% fault coverage for SAFs,SOFs,TFs,AFs and inter-CFs.Optimized the word-oriented March C-SOF algorithm and added Del element,the algorithm can be used to deal with the intra-CFs and DRFs.A BIST controller,which is realized by using a FPGA,is presented in the last sector of the paper.The test system meets the need for testability in the condition of little additional cost. |
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| Keywords: | BIST SRAM fault models SRAM test March algorithm |
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