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IMPATT二极管热阻测试
引用本文:赵大德. IMPATT二极管热阻测试[J]. 固体电子学研究与进展, 1983, 0(3)
作者姓名:赵大德
摘    要:本文讨论了热阻测试的基本理论;并讨论了如何利用海兹(Hatzi)法选择适当的测试频率测量IMPATT二极管的热阻.利用测试信号频率与热流传播深度的关系可选用不同频率测得管芯热阻或整个器件热阻.并可鉴别管芯焊接质量.本文还用实验验证了测试频率与样品面积的关系.


Thermal Resistance Measurement of IMPATT Diodes
Abstract:This paper discusses the basic principle of thermal resistance measurement, and the utilization of the Hatzi method to measure the thermal resistance of a IMPATT diode by properly choosing measuring frequencies. The thermal resistance of a chip or a device at different frequencies has been achieved in accordance with the relationship between the signal frequency and the depth of the thermal current propagated. Moreover, the welding quality of the chip can be discriminated. Also in the paper are given of experimental results proving the relation of measuring frequency to the chip area.
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