| 一个适用于多通道时间交织模数转换器采样时间误差校准算法的数模转换器 |
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| 引用本文： | 朱晓石,陈迟晓,徐佳靓,叶凡,任俊彦.一个适用于多通道时间交织模数转换器采样时间误差校准算法的数模转换器[J].半导体学报,2013,34(3):035003-5. |
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| 作者姓名： | 朱晓石 陈迟晓 徐佳靓 叶凡 任俊彦 |
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| 作者单位： | State Key Laboratory of ASIC & System,Fudan University;Microelectronics Science and Technology Innovation Platform,Fudan University |
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| 摘 要： | A sampling switch with an embedded digital-to-skew converter(DSC) is presented.The proposed switch eliminates time-interleaved ADCs’ skews by adjusting the boosted voltage.A similar bridged capacitors’ charge sharing structure is used to minimize the area.The circuit is fabricated in a 0.18μm CMOS process and achieves sub-1 ps resolution and 200 ps timing range at a rate of 100 MS/s.The power consumption is 430μW at maximum.The measurement result also includes a 2-channel 14-bit 100 MS/s time-interleaved ADCs(TI-ADCs) with the proposed DSC switch’s demonstration.This scheme is widely applicable for the clock skew and aperture error calibration demanded in TI-ADCs and SHA-less ADCs.
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| 关 键 词： | sample-time error digital-to-skew converter bootstrapped switch calibration time-interleaved |
| 收稿时间： | 5/16/2012 9:19:26 AM |
An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling |
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| Zhu Xiaoshi,Chen Chixiao,Xu Jialiang,Ye Fan and Ren Junyan.An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling[J].Chinese Journal of Semiconductors,2013,34(3):035003-5. |
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| Authors: | Zhu Xiaoshi Chen Chixiao Xu Jialiang Ye Fan and Ren Junyan |
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| Affiliation: | State Key Laboratory of ASIC & System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC & System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC & System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC & System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC & System, Fudan University, Shanghai 201203, China;Microelectronics Science and Technology Innovation Platform, Fudan University, Shanghai 201203, China |
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| Abstract: | |
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| Keywords: | sample-time error digital-to-skew converter bootstrapped switch calibration time-interleaved |
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