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多故障的电子设备系统诊断设计方法研究
引用本文:何丽,彭黎丽. 多故障的电子设备系统诊断设计方法研究[J]. 计算机测量与控制, 2021, 29(8): 7-12. DOI: 10.16526/j.cnki.11-4762/tp.2021.08.002
作者姓名:何丽  彭黎丽
作者单位:西南电子设备研究所,成都 610036
摘    要:针对复杂电子设备在使用过程中多故障诊断难的问题,以相关性模型为基础,提出了一种多故障诊断的设计方法;首先,根据相关性模型确定测试D矩阵,并获得组成单元与测试次数的关系矩阵;其次,根据每次实际测试的结果构建测试结果矩阵,并计算获得测试故障单元矩阵;最后,通过综合测试故障单元矩阵与测试次数关系矩阵的数据,确定故障单元的概率,根据故障概率定位出故障单元;通过实例验算表明:多故障诊断方法可准确定位故障单元,大幅降低误修率。

关 键 词:多故障  相关性模型  测试性D矩阵  故障诊断  测试性
收稿时间:2021-05-07
修稿时间:2021-06-07

The design method of electronic system Diagnosis With multiple faults
HE Li,PENG Lili. The design method of electronic system Diagnosis With multiple faults[J]. Computer Measurement & Control, 2021, 29(8): 7-12. DOI: 10.16526/j.cnki.11-4762/tp.2021.08.002
Authors:HE Li  PENG Lili
Abstract:In order to solve the problems of multiple fault diagnosis in complex electronic equipment, a design method of multiple fault diagnosis based on correlation model is proposed.Firstly, the testability D matrix is determined according to the correlation model, and the elevance matrix indicates the relationship between component unit and test times.Secondly, the test result matrix is constructed according to the actual test results, and the test fault unit matrix is calculated.Finally, through synthesizing the data of test failure unit matrix and test times relation matrix, the probability of failure unit is determined, and the failure unit is located according to the failure probability.The example shows that the multiple fault diagnosis method can accurately locate the fault unit and greatly reduce the invalid maintenance activities.
Keywords:multiple fault  elevance model  testability D matrix  diagnosis  testability
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