| ISO/FDIS 24173电子背散射衍射取向测定方法通则 |
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| 引用本文： | 陈家光,田青超,张作贵.ISO/FDIS 24173电子背散射衍射取向测定方法通则[J].电子显微学报,2008,27(6). |
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| 作者姓名： | 陈家光 田青超 张作贵 |
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| 作者单位： | 宝钢股份研究院,上海,201900 |
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| 摘 要： | 为了更好规范、推广电子背散射衍射分析技术，本文介绍了EBSD取向分析方法标准化的形成过程，基于GB／T19501—2004（（电子背散射衍射分析方法通则》标准，由中国主导起草并负责、制订的ISO24173（（电子背散射衍射取向测定方法通则》国际标准各阶段制订过程。作为ISO24173召集人，宝钢负责组织国内、外专家组制订该标准，目前已顺利进入FDIS阶段。文中还列出ISO／FDIS24173标准目录及标准各条款的主要内容。
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| 关 键 词： | 电子背散射衍射 取向 国际标准 |
ISO/FDIS 24173 guidelines for orientation measurement using electron backscatter diffraction |
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| CHEN Jia-guang,TIAN Qing-chao,ZHANG Zuo-gui.ISO/FDIS 24173 guidelines for orientation measurement using electron backscatter diffraction[J].Journal of Chinese Electron Microscopy Society,2008,27(6). |
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| Authors: | CHEN Jia-guang TIAN Qing-chao ZHANG Zuo-gui |
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| Abstract: | This paper briefly introduces the standardization process of ISO/FDIS 24173 guidelines for orientation measurement using electron backscatter diffraction to further standardize and extend electron backscatter diffraction technique.This international standard is based on the national standard guideline for electron backscattered diffraction analysis(GB/T19501-2004) and organized by China.As a convener,Baosteel organizes many specialists to make up the international standard,which is now successfully entering... |
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| Keywords: | electron backscattered diffraction orientation international standard |
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