Measurement of flicker phase noise of 1.4 GHz MESFET amplifier at temperatures between 300 K and 1.26 K |
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| Authors: | Hürlimann MD Hardy WN |
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| Affiliation: | University of British Columbia, Department of Physics, Vancouver, Canada; |
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| Abstract: | We have measured the phase noise of a low-noise 1.4GHz MESFET amplifier at temperatures between 300K and 1.26K and for sideband frequencies between 0.15 Hz and I kHz. In our experimental configuration the phase noise between 4.2 K and 2.17 K was large and mainly caused by bubbling of the liquid helium cryogen. However, the intrinsic phase noise, observed below 2.17 K, was lower than at room temperature, in contrast to earlier reported behaviour of amplifiers operated at X-band. |
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