首页 | 本学科首页   官方微博 | 高级检索  
     


Fast Mixing Condensation Nucleus Counter: Application to Rapid Scanning Differential Mobility Analyzer Measurements
Authors:Jian Wang  V. Faye McNeill  Don R. Collins  Richard C. Flagan
Affiliation:1. NASA Goddard Institute for Space Studies and Center for Climate Systems Research , Columbia University , New York , New York , USA;2. NASA Goddard Institute for Space Studies and Center for Climate Systems Research , Columbia University , New York , New York , USA;3. Department of Engineering and Public Policy , Carnegie Mellon University , Pittsburgh , Pennsylvania , USA
Abstract:

Condensation nucleus counters (CNCs) exhibit slower time response than expected due to mixing effects within the detector.This mixing produces an exponential distribution of delay times with a characteristic mixing time m that ranges from 0.1 s to 0.9 s for commonly used instruments and limits their usefulness for measuring rapidly changing aerosols. Moreover, when used as detectors in the scanning electrical mobility spectrometer (SEMS; also known as scanning mobility particle sizer, SMPS), CNCs limit the speed with which size distribution measurements can be made. In order to overcome this limitation, a new, fast-response mixing CNC (MCNC) has been developed and characterized. The time response of this new detector and TSI Models 3025 and 3010 CNCs has been measured using a spark source to generate an aerosol pulse. The mixing induced response smearing of this new detector, m , of this instrument is 0.058 s, which is significantly shorter than either of the other instruments tested. Its lower detection limit is about 5 nm diameter. The high aerosol flow rate of the MCNC (0.65 l min -1 ), fast time response, and low detection limit make it an ideal detector for SEMS/SMPS measurements. Using this MCNC as a detector for the SEMS, size distribution measurements over the 5 nm to 140 nm range have been made in 3 s with minimal distortion. The size distribution of a coagulation aerosol was effectively recovered by deconvolution with scans as short as 1 s. Uncertainties in the 1 s scans result, in part, from electronics problems in the scanning DMA.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号