Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K: an alternative to nonlinear scanning near-field optical microscopy |
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| Authors: | M. Vollmer,H. Giessen,W. Stolz,W. W. Rü hle,A. Knorr,S. W. Koch,L. Ghislain,& V. Elings |
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| Affiliation: | ;Fachbereich Physik und Wissenschaftliches Zentrum für Materialwissenschaften, Philipps-Universität, Renthof 5, D-35032 Marburg, Germany,;Digital Instruments Inc., Santa Barbara, CA 93117, U.S.A. |
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| Abstract: | Pump–probe measurements were performed with a sub-wavelength spatial resolution of 355 nm and a temporal resolution of 130 fs in a multiple quantum well sample at T = 8 K. A solid immersion lens was used to increase the spatial resolution to 0.41 λ, demonstrating that the limit of conventional microscopy was surpassed. |
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| Keywords: | Pump–probe spectroscopy semiconductors solid immersion lens ultrafast spectroscopy |
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