FMR and EXAFS modeling of heat-treated Fe-rich and Co-rich TM-M thin films

Ion-beam sputter-deposited alloy films of Co/sub 74/Fe/sub 6/B/sub 15/Si/sub 5/ and Fe/sub 75/Ni/sub 5/B/sub 15/Si/sub 5/ were examined for their magnetic and structural properties. Films were characterized by ferromagnetic resonance, vibrating sample magnetometry, and extended X-ray absorption fine structure (EXAFS) analysis. Using atomic parameters deduced from EXAFS modeling and fitting procedures, magnetic properties were calculated with no adjustable parameters. Correlation between perpendicular FMR measurements and EXAFS first-shell modeling suggests a low-temperature formation of cobalt-borides in the Co/sub 74/Fe/sub 6/B/sub 15/Si/sub 5/ alloy. Annealed Fe/sub 75/Ni/sub 5/B/sub 15/Si/sub 5/ samples did not display evidence of structural and/or magnetic instabilities until the onset of long-range crystallization near T/sub ann/=400 degrees C.<>