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碳纳米管原子力显微镜针尖的研究
引用本文:国立秋,赵铁强,徐宗伟,赵清亮,张飞虎,董申.碳纳米管原子力显微镜针尖的研究[J].电子显微学报,2003,22(3):259-262.
作者姓名:国立秋  赵铁强  徐宗伟  赵清亮  张飞虎  董申
作者单位:哈尔滨工业大学精密工程研究所,黑龙江,哈尔滨150001
基金项目:国家自然科学基金,the Multidisciline Scientific Research Foundation of Harbin Institute of Technology,50202006,HIT.MD.2001.04,,
摘    要:本文研究了制作碳纳米管原子力显微镜针尖的方法和过程。在光学显微镜下,通过两个微工作台操纵将纯化后的多壁碳纳米管粘结在传统的原子力显微镜的Si针尖上。运用电蚀的方法优化碳管针尖的长度使其达到高分辨率的要求。我们运用制作的碳纳米管针尖在敲击模式下时G型免疫球蛋白进行扫描成像,结果显示了其典型的Y形结构,这是传统AFM的Si针尖无法获得的。

关 键 词:碳纳米管  原子力显微镜  针尖  电蚀法  分辨率  扫描成像  AFM

Carbon nanotube tip for atomic force microscopy
Abstract.Carbon nanotube tip for atomic force microscopy[J].Journal of Chinese Electron Microscopy Society,2003,22(3):259-262.
Authors:Abstract
Abstract:In this paper we present a controlled method and process to make carbon nanotube tips for atomic force microscopy (AFM). Purified multiwalled carbon nanotube is transferred onto a conventional Si tip under viewing in optical microscope equipped with two independent translation stages. The length of a nanotube tip can be decreased by electrical etching on a conductive surface to reduce the amplitude of vibration to a level for high resolution imaging. The nanotube tips were used to image immunoglobulin G on mica with tapping mode atomic force microscopy in air. The result exhibits the characteristic Y-shaped structure that was previously unobservable with conventional AFM catilever tips.
Keywords:carbon nanotube  atomic force microscopy (AFM)  tip
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