基于扫描森林的BIST策略

在本文中，我们提出了一种改进的扫描森林结构并将其运用到基于扫描的自测试中，目的是在保证故障覆盖率的同时，将电路的扫描测试代价降低到非扫描可测试性设计的水平。为了构造这种适合于自测试(以下简称BIST)的改进的扫描森林结构，我们使用了三项技术：一种扫描触发器平衡分组策略、一种新的扫描树结构和一种新的扫描输入信号号处理办法。大量的实验结果表明，该方法与传统的基于扫描自测试方法相比，能获得更高的故障覆盖率。同时，改进的扫描森林结构相比于原始的扫描森林结构，能大幅度 减少集成电路芯片的面积开销。

BIST Technique Based on the Scan Forest Architecture

In this paper, we propose an improved scan forest architecture which is suitable for scan-based Built-In Self-Test, in order to reduce the cost of scan testing to that of the non-scan design-for-testability method. Some techniques are adopted in constructing the improved scan forest architecture: a scan flip-flop regrouping strategy, a new scan tree architecture and a scan-in pin handling method. Sufficient experimental results show that the proposed BIST technique outperforms the conventional test-per-scan BIST architecture greatly by achieving better fault coverage, and that the improved scan forest architecture reduces the area overhead drastically compared with the original one ~([1]).