| Abstract: | A double-gate tunnel field-effect transistor (DG tunnel FET) has been designed and investigated for various channel materials such as silicon (Si),gallium arsenide (GaAs),alminium gallium arsenide (AlxGa1xAs) and CNT using a nano ViDES Device and TCAD SILVACO ATLAS simulator.The proposed devices are compared on the basis of inverse subthreshold slope (SS),ION/IoFF current ratio and leakage current.Using Si as the channel material limits the property to reduce leakage current with scaling of channel,whereas the AlxGalxAs based DG tunnel FET provides a better ION/IoFF current ratio (2.51 × 106) as compared to other devices keeping the leakage current within permissible limits.The performed silmulation of the CNT based channel in the double-gate tunnel field-effect transistor using the nano ViDES shows better performace for a sub-threshold slope of 29.4 mV/dec as the channel is scaled down.The proposed work shows the potential of the CNT channel based DG tunnel FET as a futuristic device for better switching and high retention time,which makes it suitable for memory based circuits. |
