LixMn2O4 thin films characterization by X-ray,electrical conductivity and XANES |
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| Affiliation: | 1. CAS Key Laboratory for Biomedical Effects of Nanomaterials and Nanosafety, and Laboratory of Metallomics and Nanometallomics, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China;2. CAS Key Laboratory for Biomedical Effects of Nanomaterials and Nanosafety, National Center for Nanoscience and Technology, Beijing, China;3. Beijing National Day School, Beijing, China;1. School of Material Science and Engineering, South China University of Technology, China;2. School of Physics, South China University of Technology, Guangzhou 510640, China;3. Key Laboratory of Clean Energy Materials of Guangdong Higher Education Institute, China;1. College of New Energy, Bohai University, Jinzhou 121013, People''s Republic of China;2. College of Engineering, Bohai University, Jinzhou 121013, People''s Republic of China;3. State Key Laboratory of Rare Earth Resource Utilization, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, People''s Republic of China |
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| Abstract: | The spinel LixMn2O4 thin films were prepared by a new sol–gel route. The X-ray diffraction analysis confirmed the crystal structure with formation of high quality spinel at temperature of 800 °C. All the samples shown a Arrhenius type behavior in the electrical conductivity (σ), metal–insulator transition in low temperatures and decrease in the activation energy for high lithium concentration, indicating that the Fermi's level increased. When the pure spinel was formed the σ shown the maximum and the X-ray absorption near edge spectroscopy results shown a jump in the relative intensity of the O K-edge and Mn L2,3-edges. |
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