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Nanocrystalline tin oxides and nickel oxide film anodes for Li-ion batteries
Affiliation:1. State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Microelectronics and Solid-state Electronics, University of Electronic Science and Technology of China, Chengdu, 610054, China;2. College of Materials and Metallurgy, Guizhou University, Guiyang, 550025, China;1. Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, Aichi 456-8587, Japan;2. Faculty of Science and Technology, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya, Aichi 468-8502, Japan;3. Department of Materials, Physics and Energy Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, Aichi 464-8601, Japan;1. State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, Fujian, China;2. Key Laboratory of Design and Assembly of Functional Nanostructures, Chinese Academy of Sciences, Fuzhou 350002, Fujian, China;3. Graduate University of Chinese Academy of Sciences, Beijing 100049, China;1. School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, People''s Republic of China;2. Advanced Ceramics Institute of Zibo New & High-Tech Industrial Development Zone, Zibo 255000, People''s Republic of China;3. School of Chemistry, Chemical Engineering and Life Sciences, Wuhan University of Technology, Wuhan 430070, People''s Republic of China;4. Collaborative Innovation Center for Micro/Nano Fabrication, Device and System, State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, People''s Republic of China
Abstract:Tin oxides and nickel oxide thin film anodes have been fabricated for the first time by vacuum thermal evaporation of metallic tin or nickel, and subsequent thermal oxidation in air or oxygen ambient. X-ray diffraction (XRD) and scanning electron microscopy (SEM) measurements showed that the prepared films are of nanocrystalline structure with the average particle size <100 nm. The electrochemical properties of these film electrodes were examined by galvanostatic cycling measurements and cyclic voltammetry. The composition and electrochemical properties of SnOx (1<x<2) films strongly depend on the oxidation temperature. The reversible capacities of SnO and SnO2 films electrodes reached 825 and 760 mAh g−1, respectively, at the current density of 10 μA cm−2 between 0.10 and 1.30 V. The SnOx film fabricated at an oxidation temperature of 600 °C exhibited better electrochemical performance than SnO or SnO2 film electrode. Nanocrystalline NiO thin film prepared at a temperature of 600 °C can deliver a reversible capacity of 680 mAh g−1 at 10 μA cm−2 in the voltage range 0.01–3.0 V and good cyclability up to 100 cycles.
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